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 Wysłany: Śro 9:07, 22 Gru 2010 Temat postu: air jordan shoes cheap Improved to meet the test p |
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Improved to meet the test pattern generation algorithm of
fiti. cat blood). According to the concept of the critical path, the path of all the failures to meet the critical conditions can be used to test input vector, which is too large to reduce the original set of test compression. BPS generated for these faults and the test set with CNF said. We have the example in Figure 1 to illustrate the BPS algorithm. In order to produce the same fault as much as possible the test set, BPS algorithm used for sensitizing the longest path. Select fault propagation path B: a k a i one hundred and eleven (assuming b points of failure, the child Chapter 2 = 1 know,: h: cs = O, namely: tiG,: h.CF = c). First, the output z is a critical source, that is = 1, f0 ≠. Will promote the critical nature of the reverse, from f, one k requirements: 1, from the k a, requirements, = 1, from a requested h: 1, a requirement from the g: o, so that the critical conditions for 々 P1 : 1, ie d: 0: which port: 1. To test all the p P1 convex. O failures, the test set is (n, 6,[link widoczny dla zalogowanych], c, h) Iabhc = 1. To test all of the M. Pl A failure, the test set is I (n, b, c, h) l. bhc: 1l. An example of around 1BPS Biao 1. A Ⅻ knock IeofBPS In this example, the critical nature of the fan-out slip from the source to the fan-out forward, we arbitrarily outside the path of fan-out branch out Consumers (assignment conditions: 1, wide = 1), which so because one or some of the fans are known to slip out of the critical time to determine the source of the critical fan-out of more complex .... If this issue is resolved, can reduce the sensitization conditions, increase reverse path sensitization probability of success,[link widoczny dla zalogowanych], not much in this discussion. SAT-ATPG algorithm is embedded in BPS, the reduced time and the composition of CNF search space, as shown in Figure 1, the need to construct b, g, i,[link widoczny dla zalogowanych],, z point of failure and fault diagnostic = LJLJ. However, BPS algorithm is a single control method,[link widoczny dla zalogowanych], not a complete algorithm, so after the end of BPS algorithm, the remaining section of the method of fault generated by 1,2-tested to generate complete test set. 4 Results and Conclusion In order to validate improved testing method to observe the experimental results of ISCAS'85 benchmark circuits. SAT-ATH ~ 64M of the 586/200 in the memory to run. Games of the results in Table 2. This table that the average CPU time for each fault in milliseconds (II】 s). # F. # D, # R and # A denote the total number of faults, diagnosis number, the number of redundancy and is not diagnostic. Visible, SAT can prove whether the fault of each ISCAS'85 circuit redundancy. Another is to generate most of the time cPu CNF type. Shows the reverse path sensitization algorithm BPSA embedded SAT. ATPG in ISCAS'85 benchmark circuits can reduce the formation of fault diagnosis GNF time, simplify the search space and accelerate test generation. And compression to reduce the workload of failure, without loss of streamlining the final test set. 3 Tseng Bi, et al: Improved rinse can capture enough of the test vector generation algorithm 57 Table 2 Basic circuit simulation | Vision Fruit m. 2Results roar 1heISCbemlamrkeh-cu ~ References: [1] Wei Daozheng. Fault simulation of a digital circuit is a critical path tracing method improvement [J]. Computer Aided Design and Computer Graphics,[link widoczny dla zalogowanych], 1989,1 (i) :38-44. [2] LanaheeT. 1pme ∞ usinghodean cricket population [J]. IEEETamCAD. 1992.11 (1); 4-15. [3] sch】 kMH-1HE. eta1. Soemtes: ahigwy ~ elentalRO-maticpatternon [J]. IEEETrmCAD, 1988,7 (1) :126-137. [4] PomemalgI, laimhmlReddyN. . ~ ThakarReddyM. c plate. Pa: amethodto to _ l adjacent surface canthal shabu Emirates np L drunk bait forco. cizea ~ 【J]. IEEETranCAD, 1993,12 (7): 10401048. 【5] ‰ phanPR, Bl '~ yto ~ lRK, eta1.0KElar at secluded IIga Miss ty [J]. IEEETranCAD1993.15 (9): 11671176. [6] ~ lvaPM-s at Rda. ~ KA. Algo6th ~ forpatterngen. ∞ [A]. PrccrrcEc]. PBtorms, 1997.1 Union 161. c} a series of cabinet Bei
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